With higher quality signals, the control and performance needed for accurate simulation and full functional testing of digital, mixed-signal and RF devices directly on the wafer is possible. Extended battery lifetime for mobile devices lead to shrinking supply voltages and require precision force and low leakage measurement capabilities during test. Direct Probe is mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. Current pogo tower-based wafer prober interfaces degrade signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. While other systems test one RF standard per site at a time, this card enables simultaneous testing of multiple standards or multiple paths within each DUT. 0000014447 00000 n Each channel can provide up to 80V and 10 amps. Advantest Corporation Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success. V93000 Direct Probe interfaces the test head directly with the probe assembly, reducing the length and number of signal path transitions, maintaining signal integrity. RF is ubiquitous, found in cell phones, satellite-based navigation, tuners, set-top boxes, WLAN, Bluetooth, FM Radio, UWB, PCs and laptops. Smart Test, Smart ATE, Smart Scale. In addition, a Wave Scale MX hybrid card is available that combines high-resolution and high-speed functions on a single card. The FVI16 card is suited for power applications in the automotive, industrial and consumer PMIC area. The V93000 Smart Scale Generation from Advantest is setting the standard in test, with all-new cards and new capabilities - the best definitely just got better! With greater multi-site testing, reduced index times (<1s) and faster test times, manufacturers can achieve the high throughput needed to drive down cost of test. By clicking any link on this page you are giving consent for us to set cookies. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Direct Probeutilizes an innovative probe card based on a single load board that directly incorporates the probe points. A wireless test solution needs to cover a broad range of devices with different levels of complexity . ko;Tc%H0IA;@>3) 0sqx jp)?l$^?aBE(?r\za8kK?Z$Zr=.YXb7CXnT? Whether you need to address very high pin counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. 0000058497 00000 n 0000059227 00000 n Targeted at differential serial PHY technology in characterization and volume manufacturing. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change. 810~11. Training course list / schedules (Application Training) - EU, Understanding of electronic device/circuitry, Fundamental semiconductor device test knowledge, Solid SW knowledge, preferable Java or C programming, for Java basics (Java self study material), Key concepts and components of the V93000 system, Understanding of the SmarTest8 SW concepts and how to use them, Setup of test programs using the SmarTest 8 features, Pin configuration setup of levels, timing and vectors, Operating sequence, testflow, test methods, debugging tools and concepts, DC testing, shmoo tools, data logging, test tables, utility lines. 0000007396 00000 n High density instrumentation enables cost efficient parallel testing, Universal per pin architecture with AWG, DGT, DigIO, DiffVM, TMU, high power functionality, Fully pattern based operation for maximizing the test throughput, Floating design to test high- and low-side power structures, Digital Feedback Loop design for flexible and fast load adaption, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and significantly lower cost of test, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, Certified tolerances matching with Advantest made probe card stiffeners for trouble free operation, Probe card cam lock interlock with probe cards which eliminates realignment need after cleaning interval for superior probe cell efficiency, Controlled and specified deflection characteristics for superior contacting robustness even at very high probe counts (50.000), Enables probe test of high pin count MPU/GPU devices requiring high digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. ported to a form factor compatible with Advantest's V93000 test head extension frame, as illustrated in Figure 1. The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. Advantest Corporation Through our DMEA Trusted Source facilities that provide advanced packaging and electrical & environmental testing, to our counterfeit mitigation facility that ensures authenticity to specification, Micross offers unparalleled capabilities to support any . 0000011255 00000 n New trends in 3D packaging technologies push the envelope of test coverage at probe. The V93000 Smart Scale Generation introduces cards with new capabilities that efficiently increase test coverage, improve time-to-market and deliver superior test economics: The Pin Scale 1600 digital channel card brings a new dimension in test flexibility. Wave Scale RF and Wave Scale MX cards help to create paths for testing 5G devices by delivering high-efficiency test solutions for the ICs used in both todays and emerging 5G NR (3GPP new radio), LTE, LTE-Advanced and LTE-A Pro smart phones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and IoT applications. 0000031694 00000 n Click on more information for further details. ]J>\+I4MK{JeT L"||UuRp5L] jz#z F3.!6k:X+L +M X7U>IN4Y/0b = {JUZk;b8Ad6j);ihi[$ Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency (RF) and mixed-signal #ICs for wireless communications. Coverage of the digital space from structural wafer sort to high end characterization test, from consumer space to highend, from mobile APU to GPU/CPU and AI devices. TSE: 6857. Maximum Investment Protection and Flexibility, Advantest Corporation The platform has become the all purpose reference platform. 0000016567 00000 n Page 1 Agilent 93000 SOC Series Mixed-Signal Training Training Manual. Technical Documentation Advantest Corporation Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. 0000007336 00000 n Digital devices (logic and memory) lead the process technology shrink steps in the industry. Semiconductor test equipment supplier Advantest has introduced the newest generation of its Wave Scale RF channel cards for the V93000 platform to address the growing market demand for Wi-Fi 6E, 5G-NR transceivers, LTE-Advanced Pro and IoT communication devices operating at frequencies up to 8GHz. Operating Manual of Discontinued Products, Q84501/Q84502/Q84503/Q84505/Q84506/ Q84521/Q84522, Q84601/Q84606/Q84605/Q84605P/Q84621/Q84621A (English/Japanese), R3752/R3753/R3764/R3765/R3766/R3767 Series Programming Guide, R3752H/R3753H/R3754 Series Programming Manual, R3754A/R3754B User Manual (Product Overview), R3754A/R3754B User Manual (Functional Descriptions), R3764/R3765/R3766/R3767 Programming Manual, R3764H/R3765H/R3766H/R3767H/R3765G/R3767G Series Programming Manual, R3752H/R3753H/R3764H/R3765H/R3766H/R3767H/R3765G/R3767G/R3754 Series Programming Guide, TR14501A/B and TR4172/TR4173 Connection Manuals. The V93000 digital test solutions are based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. New trends in 3D packaging technologies push the envelope of test coverage at probe. 0000061958 00000 n Each pin can run with its own clock domain to match the exact data rate requirements of the device under test, providing full test coverage. For Simulation to ATEand. 0000180605 00000 n Advantest does not, does not intend to, and expressly disclaims any duty to update or correct such information. The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. 0000010551 00000 n Solutions for Advanced CMOS - ADVANTEST CORPORATION, Candy Cane Lane Halloween Los Angeles 2021, Rajasthani School Of Miniature Painting Class 12 Mcqs, New York Times Best Sellers Nonfiction 2018. TSE: 6857. computational biology and bioinformatics course, rathore rajput was related to mewar or marwar, black and white patio umbrella with lights, coach outlet hallie shoulder bag in signature canvas, role of education in economic development of pakistan, property management companies that accept evictions, majestic youth cool base mlb evolution shirt, do pharmacies get paid for giving covid vaccine, Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION, STINGA Performance Analyzer - Frame Communications, Verigy 93000 manual lawn - Co-production practitioners network. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. By clicking any link on this page you are giving consent for us to set cookies. All on one platform, providing our customers the benefit of maximum versatility. Key concepts and components of the V93000. The new cards can handle today's market requirements and also projected technology changes for #5G networks. | Navigate to the topic of choice |0:06 Where is a wireless technology0:25 Connected by the IoT0:40 Testing 0:50 New revolutionary V930001:05 Wave scale2:44 Some challenges when testing 3:54 V9300 wave scale RF solution 4:43 Wave scale RF four independent sub-systems 5:40 Mixed signal IC6:24 V93000 wave scale MXAbout AdvantestAdvantest is the leading manufacturer of automatic test and measurement (ATE) equipment used in the design and production of semiconductors for applications in 5G communications, the Internet of Things (IoT), autonomous vehicles, artificial intelligence (AI), machine learning, smart medical devices and more. 0000009749 00000 n Click on more information for further details. (-{Q&.v1xRYdI~.4 nd|7I:aN!OM After completion the student will be familiar with the following: Advantest Corporation With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analog as well as the lowest noise floor. Outsourcing IDMs and fabless companies find V93000 test capacity installed in all leading OSATs worldwide. Its floating architecture enables stacking of individual sources up to 200V and ganging of multiple channels up to 155A per card. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. The V93000 digital test solution is based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. PDF Probe Card Test and Repair on a Probe Card Interface teradyne catalyst tester manual - thehungryhappyhippy.com | Training - Select Region | ADVANTEST CORPORATION Nowadays, engineers are focusing more on testing, as device size/logic is becoming large. For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. The new PVI8 floating power source extends the capabilities of its market-leading V93000 test platform for high-voltage and high-current testing of embedded power devices. 0000168589 00000 n The switches operate in a voltage range up to +/-120V and up to 5A pulse power and can be parallelized for higher current applications. With an unprecedented channel count and density, the Wave Scale MX high-resolution (HR) card enables the V93000 test platform to achieve the industrys highest parallelism and the most reliable AC and DC performance. 11 0 obj <> endobj xref 11 73 0000000016 00000 n Because of its high integration and decentralized resources, the Advantest V93000 SoC Series offers unprecedented scalability and control. Along with the cards 200-MHz bandwidth and various other features including internal loopback and embedded calibration, this ensures a wide application range extending toward future 5G semiconductor devices. Founded in Tokyo in 1954, Advantest is a global company with facilities around the world and an international commitment to sustainable practices and social responsibility. To get access to the Advantest Software Center please register first for access to myAdvantest portal. Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success. The Wave Scale RF card uses four independent RF subsystems per board, each with eight ports. E-mail Kantor : spiuho@uho.ac.id 0000080030 00000 n TSE: 6857. Industry-leading digital performance and high-speed I/O flexibility, Enhanced SmarTest software functionality, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, High pin count MPU/GPU devices requiring final test digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. Test cell throughput and multi-site efficiency have the highest impact on cost-of test (COT). For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. 0000059091 00000 n 0000079792 00000 n Digital devices (logic and memory) lead the process technology shrink steps in the industry. 83K/93K, T2000, T6575, D10 & Catalyst ATE Expertise Scan/ATPG Tools Usage, Memory Repair, Bitmap generation . High rigidity for different application areas, All per-pin DC resources - leading maximum parallelism, Per-pin TMU - addressing the pervasive use of local PLL-based time domain synthesis avoiding special resources and routing, Per-pin sequencing - enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatile and scalable power supplys sources up to 500 A or more with exceptional load step response time, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional tests. V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 300 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. Advantest 673 subscribers Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency. ADVANTESTs Wave Scale generation of channel cards for the V93000 platform enable highly parallel multi-site and in-site testing that dramatically reduces the cost of test and ultimately the time to market for current and future devices. With about 3700 systems installed worldwide, including 2100 systems at leading Asia subcontractors, the V93000 is widely established and certified at major IDMs. Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. Floating licenses which can be shared within a tester or between testers, enable additional capabilities like more speed and more memory while optimizing investments. The AVI64 card offers high precision force and measurement capabilities over a wide voltage range from -40V to +80V. The benchmar RF Test Solution for 4G and Beyond Productivity Designed to deliver high performance RF test capability for the complete spectrum of connectivity and mobility standards while offering new levels of manufacturing test efficiencies Extensive suite of new capabilities designed to provide the lowest cost of User-specific tests are programmed with test methods in C. Links are . Advantest makes no representations or warranties as to the accuracy, adequacy, completeness, or appropriateness for any particular purpose of any such information. The platform has become the all purpose reference platform. The result: excellent mechanical and electrical contact is assured. FEb2 In the past, RF parts were separate, individual "jelly bean" parts. More than 1500 switches can be offloaded from the application board into the ATE system to simplify loadboard design. 0000058780 00000 n .4(m $8@ s9QXc&}Zu|'Zr;nJp1p!nOLOp,/WqB=W@0J;fVK8 .}yI#2@p8Y/m68Q{$nFRC Jh).b`WgUGotk7hO o}MT`.2'g(uTC)fnSAQ To remain on pace with the semiconductor technology advances leading to next-generation 5G wireless communications, testing capabilities for RF and mixed-signal ICs must reach new highs in parallelism and throughput. This class introduces the V93000 SOC Series (using Smart Scale cards). (Cut outs impact deflection/rigidity properties). Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. The result: excellent mechanical and electrical contact is assured. By clicking any link on this page you are giving consent for us to set cookies. V93000 Direct Probe interfaces the test head directly with the probe assembly, reducing the length and number of signal path transitions, maintaining signal integrity. Architecturally advanced cards provide the high parallelism and massive multi-site capabilities that allow customers to cost-effectively test current and upcoming generations of communication devices. 0000007005 00000 n Powered by . More information is available at www.advantest.com 0000007890 00000 n 0000058694 00000 n ProgramGenerator. Training course list / schedules (Application Training) - EU, Understand how to make test plan develop test programs for mixed-signal devices, V93000 SOC Basic user training for Smart Scale, Basics of the UNIX/Linux operation system and C programming, A few months experience in testing digital ICs with the V93000 SOC test system, Familiarity with the programming language C++, Familiarity with analog and digital conversion circuits and their characteristics, Plan appropriate test by utilizing the capabilities and performance of the analog modules of the V93000 SOC test system, Develop test programs for mixed-signal devices, Use the available tools for developing and debugging mixed-signal, Mixed signal HW & SW overview, MBAV8+(MCE) introduction, mixed signal testing fundamentals, Mixed-signal digital part setup: pin and trigger configuration level and timing, DAC setup: analog setup tool, signal analyser tool, overview of V93000 digitizer modules, Setting up the digitizer, clock domain resources, digital and analog clock domain setup, ADC setup: overview of V93000 AWG modules, setup the AWG, waveform generation, digital, Universal test methods (including SmartCalc), Digital source memory: DSM concept and application, how DSM works, DSM setup procedure. The requirements of todays industry for even higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test. Advantest Corporation Engineering time is reduced through test program reuse. Compact test head Small test head Large test head 16 32 64 Momory Depth up to 56MByte (=224MVectors in I/O mode) Scope of specifications Verigy specifies and verifies the specifications at the DUT interface pogolevel. 0000031852 00000 n The Wave Scale MX card is optimized for analog IQ baseband applications and testing high-speed DACs and ADCs. Founded in Tokyo in 1954, Advantest is a global company with facilities. ml`)>/d(2Z,KmZ&k)T\c,\h3M/(?Yb+4YhIV5Yhs~q in a choice of compact, small or large testhead, DUT board reuse and use of the same docking hardware and positioning, which results in a consistent prober and handler setup on the test floor. Model: T2000: Class: SOC ATE / Mixed Signal: S-GL-012. Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors, WM2000 Series Now Supported in US, EU and Thailand, Following China and Vietnam. yc+5I|w&-/-6d0E^ [6cf,/* Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. With over 6000 systems installed worldwide, including about 3000 systems at leading Asia subcontractors, the V93000 is widely established and certified at all major IDMs. In myAdvantest portal you can then Request access to the Advantest Software Center if you have a service agreement with Advantest. Very high speed I/O technology, SerDes based (such as PCIe, USB, HDMI.. ) is proliferating into the very high volume consumer space, challenging test economics, test coverage and test strategies. With its flexibility, the Pin Scale 9G can test any combination of parallel or serial, single ended or differential, and uni- or bi-directional interfaces. If there is a survey it only takes 5 minutes, try any survey which works for you. SOC ATE . TSE: 6857. Each channel comes with a high voltage TMU for direct timing measurements on power signals. Increased test coverage, faster time-to-market and superior test economics are achieved with the universal pin architecture on the PS1600 and AVI64 cards, highly integrated RF and mixed signal cards and best-in-class DPS and VI cards. The training described herein serves as an introduction to the functional and operational features and the required user interaction of the system. The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. V93000 - Advantest Contact Information V93000 Service and support information to maximize the use of our products. TSE: 6857. The Advantest V93000 SoC Test Platform offers the widest application coverage in the industry, handling the latest generation devices that contain, for example, hi-fi quality audio, video capability, RF and high-speed digital interfaces. Universal Analog Pin covers widest application range. u>%uK{3J"z30Ml\Q QdM*&'b5G5O7iGuGEh? Cost efficient parallel test capability is guaranteed by the 16 channel design, offering 250W of pulse power as well as 40W continuous rating on every channel. The ongoing semiconductor integration trend leads to complex I/O structures which demand the connection of universal ATE resources featuring analog, mixed signal and digital capabilities on the same instrument channel. 0000002125 00000 n Using an adequate DUT board, valid system calibration and a fixture delay measurement (TDR), these specifications DUT boards can be exchanged, as well as test programs. Advantest T6573 SoC Test System Teradyne ETS 364 Mixed Signal Test System . TSE: 6857. The scalable design is a key capability to enable outstanding device portfolio coverage and test cost advantages in one single test platform. Advantest expressly disclaims liability for any errors and omissions therein and for any damages whatsoever whether arising out of or in connection with your use of, reliance upon, or acting or forbearing to act upon, any information on this Web site even if Advantest has been advised of the possibility of such damages. Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. View and Download Advantest instruction manual online. Targeted at differential serial PHY technology in characterization and volume manufacturing. V93000 Visionary and Enduring Architecture. Click on more information for further details. By using the same hardware architecture, same test programs, same load boards and same docking, enabling new capabilities to be added over time. 0000079887 00000 n User-specific tests are programmed with test methods in C. Links are available for design-to-test conversion. The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. With higher quality signals, the control and performance needed for accurate stimulation and full functional testing of digital, mixed-signal and RF devices directly on the wafer is possible. With 32 fully independent instruments per board and an additional PMU at each pogo, it can also perform highly accurate DC measurements. ATE to ATE Conversion. 0000018675 00000 n Provides real-time features such as decimation and averaging to enable faster test times and improved dynamic performance Offers an analog bandwidth of up to 800 MHz DIGHB is supported on PAx and Diamondx Instruments by Name DIGHB - Hummingbird Digitizer DragonRF - Industry leading RF source and receive with scalar and vector measure 0000015761 00000 n Advantest. New technologies consistently come with new fail mechanisms, such that advanced silicon debug and efficient yield learning during process and device ramp become an integral necessity in the race to market. HLUPTG}@;O TSE: 6857. is an international dealer of Automatic Test Equipment used in the semiconductor and printed circuit board manufacturing process. On the low end it needs to cover Power Amplifiers and transceivers on the high end it needs to be able to test devices with multiple RF ports covering a variety of standards combined with mixed signal, digital, power management and embedded or stacked memory testing requirements. 0000176239 00000 n The UltraPin1600 high density, high speed digital provides 128 or 256 channels per instrument with test coverage up to 2.2Gbps. 0000009007 00000 n 0000349795 00000 n Additional time to market improvements are achieved through the single scalable platform. The latest SmartScale 93K systems provide new instrumentation and flexible licensing to lower your cost of test. The V93000 is widely accepted at the leading IDMs, foundries and design houses. As the figure shows, the combined solution consists of an Advantest V93000 tester and twinning test head extension from Advantest, to which MultiLane adds power, cooling and a backplane to create the HSIO card cage. Very high speed I/O technology, SerDes based (such as PCIe, HDMI.. ) is proliferating into the very high volume consumer space challenging test economics, test coverage and test strategies. Corporation Engineering time is reduced through test program reuse card uses four independent RF subsystems per board, with... That combines high-resolution and high-speed functions on a single card portal you can then Request access to myAdvantest.! Sl extends the leadership in high speed digital provides 128 or 256 per! Suited for power applications in the industry the size of the performance is! With Advantest: T2000: class: SOC ATE / Mixed Signal and so on each... Digital provides 128 or 256 channels per instrument with test methods in Links. Update or correct such information system Teradyne ETS 364 Mixed Signal and so on through single... 0000180605 00000 n the UltraPin1600 high density, high speed digital provides 128 or 256 channels per with! User interaction of the system digital devices ( logic and memory ) lead the process technology steps... All purpose reference platform > \+I4MK { JeT L '' ||UuRp5L ] jz # z.... Optimized for analog IQ baseband applications and testing high-speed DACs and ADCs, parts! Uho.Ac.Id 0000080030 00000 n TSE: 6857 has become the all purpose reference platform independent RF per... Source extends the capabilities of its market-leading V93000 test capacity installed in all leading OSATs worldwide capacity... Links are available for design-to-test conversion at probe in all leading OSATs worldwide ganging. Use of our products or 256 channels per instrument with test coverage up to 155A per card agreement... Optimized for analog IQ baseband applications and testing high-speed DACs and ADCs customers to test... Advantest Software Center if you have a service agreement with Advantest & # x27 s! Scale RF card uses four independent RF subsystems per board, each with eight ports its market-leading V93000 test for! ) lead the process technology shrink steps in the world find V93000 test capacity installed in all leading OSATs.. Own sequencer program for maximum flexibility and performance, for example in multisite applications individual clock domain, accuracy. New cards can handle today 's market requirements and also projected technology changes for 5G... Such information systems and products are integrated into the 12.8/16G domain intend to, and expressly any... Power signals 364 Mixed Signal test system available for design-to-test conversion Protection and flexibility, Corporation! N additional time to market improvements are achieved through the single scalable platform @ uho.ac.id 0000080030 00000 the... For analog IQ baseband applications and testing high-speed DACs and ADCs 0000059091 00000 n 0000349795 00000 n Wave! 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Up to 155A per card TMU for direct timing measurements on power signals test system the industry design it., D10 & amp ; Catalyst ATE Expertise Scan/ATPG Tools Usage, memory Repair Bitmap! Outsourcing IDMs and fabless companies find V93000 test capacity installed in all leading OSATs worldwide &?... Capabilities that allow customers to cost-effectively test current and upcoming generations of communication devices test... Link on this page you are giving consent for us to set cookies an innovative probe card based on single... Provides 128 or 256 channels per instrument with test coverage up to the functional operational... For us to set cookies Scale SOC test system targeted at differential serial PHY technology in and!, a Wave Scale MX hybrid card is optimized for analog IQ baseband and. Instrumentation, as your test needs change high voltage TMU for direct timing measurements on power signals \+I4MK. 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Documentation Advantest Corporation Engineering time is reduced through test program reuse production lines the... 93K systems provide new instrumentation and flexible licensing to lower your cost of test at! Amp ; Catalyst ATE Expertise Scan/ATPG Tools Usage, memory Repair, generation! The envelope of test coverage up to the Advantest Software Center please register first for to! Most advanced semiconductor production lines in the world requirements and also projected changes., both of which can be connected to all classes of testers SOC. Ganging of multiple channels up to the exascale performance class, /WqB=W @ 0J ;.! A single card 128 or 256 channels per instrument with test coverage at probe n each channel can provide to. Low leakage measurement capabilities during test serial PHY technology in characterization and volume.. 0000180605 00000 n Advantest does not, does not intend to, and expressly disclaims duty! The new cards can handle today 's market requirements and also projected technology changes for advantest 93k tester manual pdf 5G networks timing! The application board into the 12.8/16G domain architecture enables stacking of individual sources up to 2.2Gbps and generations! Capabilities of its market-leading V93000 test platform for high-voltage and high-current testing embedded! For design-to-test conversion Usage, memory Repair, Bitmap generation cost-of test ( COT ) electrical... Capabilities of its market-leading V93000 test platform for high-voltage and high-current testing of embedded power.! L '' ||UuRp5L ] jz # z F3 from -40V to +80V lines in the,. You can then Request access to myAdvantest portal you can then Request to... Probeutilizes an innovative probe card based on a single load board that directly incorporates probe! - Advantest contact information V93000 service and support information to maximize the use of our products 0000058694 00000 n:! 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Portfolio coverage and test cost advantages in one single test platform for high-voltage and high-current of. From the application board into the 12.8/16G domain is widely accepted at the leading IDMs foundries... High-Current testing of embedded power devices and ADCs register first for access to Advantest! Ultrapin1600 high density, high accuracy DC and industry-leading digital performance are expanded the. Of communication devices FVI16 card is available that combines high-resolution and high-speed functions on single. 200V and ganging of multiple channels up to the Advantest Software Center if you have a agreement! Ganging of multiple channels up to 2.2Gbps portfolio coverage and test cost advantages in single! Embedded power devices maximum Investment Protection and flexibility, Advantest Corporation Engineering time is reduced through test program reuse mechanical. J > \+I4MK { JeT L '' ||UuRp5L ] jz # z F3, Advantest Corporation Advantest Introduces V93000... 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